✦ Luna Orbit — QA & Testing

Senior Test Engineer

at Advanced Micro Devices

📍 Austin, Texas, United States Hybrid Posted March 13, 2026
Type Full-Time
Experience mid
Exp. Years Not specified
Education Not specified
Category QA & Testing

This role involves developing and debugging test plans for microprocessors, ensuring test coverage, and optimizing test infrastructure for advanced semiconductor devices.

  • Develop test plans and patterns
  • Debug silicon and yield issues
  • Optimize test flows for quality
  • Develop infrastructure for testing
  • Support characterization and debug

The position covers silicon characterization, test pattern development, debug, and infrastructure management for microprocessors using automated test equipment like Verigy 93K.

The ideal candidate is a mid-level test engineer with experience in silicon characterization, test pattern development, and microprocessor debug, familiar with automated test equipment and test infrastructure for advanced semiconductor devices.

test planningtest creationcharacterizationsilicon debugtest infrastructure
scan hardwarefailure mechanismsAC scan developmentSRAM debugBIST engineanalog DFTmicroprocessor architecturetester infrastructure
Automated Test EquipmentVerigy 93Ktest infrastructure
Test Engineeringcharacterization test planssoftware infrastructurehardware infrastructuremicroprocessor debugsilicon characterizationATE test patternstest flowsscan hardwarefailure mechanisms
Test Engineeringcharacterization test planssoftware infrastructurehardware infrastructuremicroprocessor debugsilicon characterizationATE test patternstest flowsscan hardwarefailure mechanismsAC scanSRAMBISTanalog/mixed signalmicroprocessor architectureAutomated Test EquipmentVerigy 93Kconnectivity-based testing
analyticalproblem-solvingcollaborativecommunicationdetail-oriented
Industry Technology / Semiconductor / Electronics
Job Function Microprocessor test development and debug
Test Engineeringcharacterization test planssoftware infrastructurehardware infrastructuremicroprocessor debugsilicon characterizationATE test patternstest flowsscan hardwarefailure mechanismsAC scanSRAMBISTanalog/mixed signalmicroprocessor architectureAutomated Test EquipmentVerigy 93Kconnectivity-based testing

Lack of experience with silicon characterization, No familiarity with test infrastructure, Inability to work in a hybrid environment in Austin, Lack of experience with microprocessor testing

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